【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Flammabilityofplastic-encapsulateddevices(internallyinduced)
【原文标准名称】:半导体器件.机械和气候试验方法.塑料包封器件的易燃性(内部感应)
【标准号】:BSEN60749-31-2003
【标准状态】:现行
【国别】:英国
【发布日期】:2003-07-04
【实施或试行日期】:2003-07-04
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:热学;集成电路;电学测量;温度变化;气候试验;可燃性;半导体器件;环境试验;外观检查(试验);元部件;半导体;试验;电子工程;电子设备及元件;电气工程;耐力;易燃性;机械试验
【英文主题词】:Changesoftemperature;Climatictests;Components;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Environmentaltests;Flammability;Heat;Inflammability;Integratedcircuits;Mechanicaltesting;Plastics;Resistance;Semiconductordevices;Semiconductors;Testing;Visualinspection(testing)
【摘要】:ThispartofIEC60749isapplicabletosemiconductordevices(discretedevicesandintegratedcircuits).Theobjectofthistestistodeterminewhetherthedeviceignitesduetointernalheatingcausedbyexcessiveoverloads.NOTEThistestisidenticaltothetestmethodcontainedin1.1ofchapter4ofIEC60749(1996),apartfromchangestothisclause,theadditionoftitlestoclauses2and3andrenumbering.
【中国标准分类号】:L40
【国际标准分类号】:13_220_40;31_080_01
【页数】:8P.;A4
【正文语种】:英语